$N8 DIFFRAX Multifunctional Flagship Diffractometer$

N8 DiffraX

X-ray diffraction platform for characterizing advanced materials and complex samples

Every material innovation begins with a deep understanding of structure. N8 DiffraX, with X-ray diffraction at its core, provides systematic analytical capabilities for advanced materials, complex systems, and multi-scenario applications. Whether in basic research, process development, or quality verification, it helps users capture key information within materials, making structural characterization a reliable driving force for innovation.

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Product Details
Resources
Specifications

N8 DiffraX applications that can be completed

Phase identification

Phase Identification

Determine which
phases are present

Quantitative phase analysis

Phase Quantification

Estimate the amount
of each phase

Structural Solving and Refinement

Structure Solution & Refinement

Crystal structure, atomic
positions, lattice refinement

In-situ testing in unconventional environments

Texture and Orientation

Preferred orientation
of crystallites

Texture and orientation analysis

Texture and Orientation

Preferred orientation
of crystallites

Texture and Orientation

Preferred orientation
of crystallites

X-ray reflectivity (XRR)

X-ray Reflectivity (XRR)

Thickness, density, and interface roughness

$Grazing incidence diffraction (GID)$

Grazing incidence diffraction (GID)

Grazing-Incidence Diffraction (GID)

Near-surface or depth-sensitive structural analysis

$Grazing incidence diffraction (GID)$

Grazing incidence diffraction (GID)

Grazing-Incidence Diffraction (GID)

Near-surface or depth-sensitive structural analysis

$High-resolution X-ray diffraction$

High-resolution X-ray diffraction

HRXRD

High-resolution analysis of strain, lattice mismatch, and epitaxy

PDF Analysis

Local atomic structure and short-range order

SAXS Analysis

SAXS Analysis Particle size, shape, and distribution

X-ray absorption spectrum

X-ray Absorption Spectroscopy (XAS)

Electronic structure and local coordination analysis

N8 DiffraX application directions

Universities and research institutes

Pharmaceuticals

Advanced manufacturing and advanced packaging

Batteries and New Energy Materials

Chemical Industry

Cement and building materials

Metals and Alloys

Geology and Minerals

Advanced Ceramics

Macromolecules and Polymers

Cultural Heritage and Archaeology

New functional materials

N8 DiffraX: Solid Performance, Enhanced Gains

X-ray source

Incident optical system

High-precision angle measuring instrument

Anti-scattering system

Sample stage

Diffractive optical system

Detector

System-level platform architecture for high-quality diffraction data

The overall design encompasses the light source, optical path, angle measurement system, detector, and software algorithm, building a stable data foundation around core indicators such as peak position accuracy, angular resolution, signal-to-noise ratio, and repeatability.
Through the synergistic integration of opto-mechanical-electronic and software technologies, the platform provides more reliable diffraction data output for complex sample testing, weak peak identification, and multi-scenario applications.

Beyond stability, performance is enhanced.

Basic data quality is the foundation of everything.

Peak position accuracy, angular resolution, signal-to-noise ratio, and repeatability are the core indicators for evaluating the basic performance of an X-ray diffractometer. They directly determine the accuracy of phase identification, the ability to resolve subtle structural differences, the ability to capture weak signals, and the consistency of long-term test results.

The N8DiffraX regression diffraction analysis capabilities are built upon, and through solid system design and precise engineering control, the performance of these key data is continuously improved, providing reliable support for the characterization of complex materials and high-performance applications.

• Each delivery system is randomly configured with an SRM1976c, and undergoes full-spectrum acceptance testing.

• The angular position accuracy across the entire spectrum (20~140°/2θ) is better than ±0.01°.

• The measured FWHM of the SRM 660c LaB6 (110) peak is better than 0.026°.

• Fifteen repeatability tests verified that the peak position standard deviation reached the level of ten thousand parts, and the maximum offset was better than 0.001 degrees.

• The ten-thousandth-level angular repeatability results in: more reliable and sensitive structural analysis capabilities, with angular position accuracy better than +0.01°.

N8 DiffraX unlocks multi-scenario analysis capabilities

DiffraX Vertex One™ System

Facing the challenge head-on: Signal-to-noise ratio peak-to-back ratio

DiffraX Vertex Pro™ System

Designed for every possible diffraction: Unlocking multi-scenario analysis capabilities

DiffraX Vertex One™
Optical core components

DiffraX Vertex One™
Optical path core accessories

DiffraX Vertex Pro™ System
Adapt the light path to the sample, rather than adapt the sample to the light path.

Beyond stability, performance is enhanced.

Unlocking Multi-Scenario Analysis Capabilities: Transmission Testing

The N8 DiffraX offers various X-ray sources, including Cu, Mo, and Ag, to meet diverse testing needs. It is equipped with matching optical systems, sample stages, and detector systems, providing flexible and reliable solutions for routine phase analysis, transmission testing, small-angle scattering (SAS), PDF analysis, suspension testing, pouch cell testing, and environmentally sensitive sample testing.

Transmission experiments in X-ray diffractometers are crucial for testing specific samples. For strongly preferred oriented samples, transmission mode provides more complete orientation information; for environmentally sensitive samples, sealing or protective atmospheres can reduce external influences; for suspension samples and pouch cells, X-rays need to penetrate the sample or encapsulation structure to obtain diffraction/scattering signals, thus transmission is typically used; for small-angle scattering and PDF analysis, transmission experiments are also important methods for obtaining high-quality scattering data and analyzing nanostructures and local structures. Therefore, transmission experiments help reduce orientation effects and improve the reliability of phase identification, crystal form determination, and structural analysis in these inorganic compound tests.

Unlocking Multi-Scene Analysis Capabilities: Reflectivity Testing

Key structural information of thin film materials is often concentrated in surface, interface, and nanoscale thickness variations, which conventional powder diffraction cannot fully reflect. Grazing incidence diffraction can enhance the diffraction signal of the thin film and near-surface regions, reduce substrate interference, and help analyze the phase, orientation, crystal quality, and stress state of the thin film; X-ray reflectivity testing can be used to evaluate thin film thickness, density, interface roughness, and multilayer film structures.

Unlocking Multi-Scenario Analysis Capabilities: Grazing Incidence Diffraction

Key structural information of thin film materials is often concentrated in surface, interface, and nanoscale thickness variations, which conventional powder diffraction cannot fully reflect. Grazing incidence diffraction can enhance the diffraction signal of the thin film and near-surface regions, reduce substrate interference, and help analyze the phase, orientation, crystallinity, and stress state of the thin film; X-ray reflectivity testing can be used to evaluate thin film thickness, density, interface roughness, and multilayer film structures.

Polycrystalline Powder Testing: Structural Refinement

The N8 DiffraX, relying on the DiffraX Vertex One™ system, ensures low background control and high signal-to-noise ratio acquisition capabilities. For NCM layered cathode materials, the N8 DiffraX can analyze Li/Ni atomic occupancy changes through structural refinement, assisting in the assessment of atomic mixing degree and helping users understand the relationship between structural stability and electrochemical performance.

Facing the Challenge: Peak-to-Background Ratio

The N8 DiffraX, relying on the DiffraX Vertex One™ system, ensures low background control and high signal-to-noise ratio acquisition capabilities. Even against a strong signal background of 94.6% SiC main phase, it can still identify trace Si phases as low as 0.2%, and distinguish between 3.0% and 2.2% SiC trace phases with different structures, demonstrating excellent weak peak detection capabilities and complex phase resolution capabilities.

Facing the Challenge: Signal-to-Noise Ratio

Thanks to the IDONÅNO DiffraX Vertex One™ system, instrument background and noise are minimized.

The peak-to-background ratio of the strongest peak in high-fluorescence Fe2O3 samples exceeds 100 times, and the signal-to-noise ratio of weak peaks is improved by more than an order of magnitude.

The limits of detection and quantitation are significantly improved.

Unlocking Multi-Scenario Analysis Capabilities:
Texture and Stress Testing

Texture and stress directly affect the mechanical properties, service reliability, and processing stability of materials. Texture testing can reveal the grain orientation distribution, helping to determine the impact of processes such as rolling, deposition, and sintering on the anisotropy of materials; stress testing can assess the residual stress state inside materials, assisting in the analysis of deformation, cracking, warpage, and failure risks, and providing key evidence for process optimization and quality control of metals, ceramics, thin films, and functional materials.

The core configuration for texture and stress testing includes: a point light source, an Eurasian ring sample stage (XYZ sample stage), and a two-dimensional detector.

• Texture measurement of silicon steel can visually reveal the distribution characteristics of grain orientation within the material.

Pole diagram/texture diagram analysis can determine whether a dominant orientation favorable to magnetic properties has been formed, and assess the degree of orientation concentration and anisotropy level, thus providing key basis for optimizing silicon steel rolling and annealing processes and improving magnetic properties.

Unlock multi-scenario analysis capabilities:
Micro-area testing

Based on micro-area XRD testing of geological samples, the N8 DiffraX can simultaneously acquire two-dimensional diffraction images and one-dimensional diffraction patterns. The test results show that the two-dimensional diffraction pattern reveals distinct discontinuous Debye ring diffraction characteristics in some mineral phases of the sample, indicating a strong preferred orientation rather than a completely random powder state. Combined with the phase identification results from the one-dimensional pattern, further analysis of mineral composition, orientation characteristics, and structural differences in local areas can be conducted, providing a reliable basis for micro-area phase analysis and structural characterization of complex geological samples.

The core configuration for micro-area testing includes: point light source, laser video positioning system, XYZ sample stage, and two-dimensional detector.

Unlock multi-scenario analysis capabilities:
In-situ testing

The N8 DiffraX supports various in-situ XRD analyses, including those based on temperature, atmosphere, humidity, pressure, electrochemistry, and reaction processes. This allows users to observe phase transitions, crystal structure evolution, lattice parameter changes, and reaction intermediates in materials under near-real-world conditions. By continuously tracking the structural response under external fields, the N8 DiffraX provides more direct and reliable experimental data for phase transition mechanism research, thermal stability assessment, battery charge/discharge process analysis, catalytic reaction process characterization, and material performance correlation studies.

In-situ test of ternary materials charge-discharge cycles

Resources

$N8 DIFFRAX Multifunctional Flagship Diffraction Sample Book$

N8 DIFFRAX Multifunctional Flagship Diffraction Sample Book

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Specifications

Goniometer	Vertical angle measuring instrument
Measuring radius	The preset size is 300mm and can be continuously adjusted.
2Theta Angle measurement range (depending on the attachment)	-110 to +168 degrees
Angle measuring instrument positioning method	Stepper motor + optical encoder
Minimum step size	0.0001 degrees
Full spectrum acceptance accuracy	NIST SRM 1976c Full spectrum better than ±0.01 degrees
X-ray wavelength	Cu, Co, Mo, Ag, Cr, etc.
X-ray generator	3KW or 4kW
X-ray optics	0D multilayer film mirror 1D Multilayer Mirror (Parallel or Focusing) 2D multilayer reflective film
Detector	PhiniX Line™ One-dimensional array detector PhiniX Area™ Two-dimensional array detector PhiniX XE™ Two-dimensional energy-resolution array detector
System energy resolution (depending on configuration)	300eV-600eV
External dimensions (height x depth x width)	156cm×114mm×205cm
Weight	650Kg
Power supply	Single phase: 210-240 V
Maximum energy consumption	6.5kVA
Cooling water supply	Minimum 3.8 L/min, pressure 4-7 bar, temperature 10-23 degrees Celsius