$N3 PhiniX Multifunctional Benchtop Diffractometer$

N3 PhiniX

Multifunctional Desktop X-ray Diffraction Solution

The N3PhiniX series diffractometers offer performance and functionality comparable to traditional large-scale diffractometers. The N3 uses only internationally leading, mature products for its main components, ensuring high performance and stability at every stage. It meets the needs of qualitative and quantitative phase analysis, as well as analysis of thin film grazing incidence, thin film reflectivity, in-situ, and pair distribution function (PDF).

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Specifications

A New Design Concept for the N3 PhiniX Series Diffractometers

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The N3 PhiniX series adopts a modular control design

Modular Control:
Data acquisition module, detector control module, X-ray generation module, goniometer control module, and safety module.
Modular Function:
Hardware and software are modularized according to their functions, making it easier for users to change samples and for engineers to maintain.

N3 PhiniX Series Diffractometer: Main Components and Accessories

The N3 PhiniX series diffractometer fully rivals the performance and functionality of traditional large-scale diffractometers. This is fundamentally due to its excellent system integration, high-quality components, and comprehensive accessory information. All major components of the N3 utilize internationally leading, mature products, ensuring high performance and stability at every stage. A rich set of accessories meets the needs of qualitative and quantitative phase analysis, thin film grazing incidence, thin film reflectance, in-situ, and pair distribution function (PDF) analysis.

N3 PhiniX equipped with Z-axis sample stage

N3 PhiniX equipped with an 8-position autosampler

A simple and easy-to-use control software GUI

IdoMeas© is independently developed by IdoMeas.

A software system for instrument control, data measurement, and some data analysis functions

Main functions of IdoMeas©

X-ray source control

Voltage/current settings
X-ray switch control
Shutter control

Detector settings

Channels and Angle Settings
Position and Mode Adjustment

Sample stage control

Sample position loading and initialization
Sample position adjustment

Goniometer Control

Position controls (e.g., Tube Pos, Detector Pos, 2Theta, etc.)
Scan mode selection
Scan type settings

Scan parameter settings

Scan speed and step size settings
Scan range settings

Data processing and management

Data saving and export
Data comparison function
Fitting function

Real-time status display
Security control

Log recording

Run log

User Configuration and Settings

Configuration saving; parameter updating and initialization

Superior Performance, Pursuit of Excellence

Optimized Algorithms Safeguard Resolution, Intensity, Accuracy, and Repeatability

Relying on scientific and meticulous light-aligning procedures and intelligent algorithms, the N3 PhiniX series diffractometers achieve the pinnacle of performance among compact diffractometers in terms of peak angle accuracy, absolute peak intensity and signal-to-noise ratio, and minimum angular resolution, while also being fully comparable to most large diffractometers on the market.

2θ angular deviation across the entire spectrum: Δ2θ < ±0.01° (NIST 1976c corundum)

LaB6 standard sample half-width at half-maximum ≤ 0.05°<br />(Standard test conditions: Soller 2.5°, detector channels 200)

LaB6 standard sample half-width at half-maximum ≤ 0.05°
(Standard test conditions: Soller 2.5°, detector channels 200)

Comparison of the strongest peak intensity of corundum collected by the N3 PhiniX series at different power levels

The standard deviation of 25 repeatability tests is better than 0.05%.

The standard N3 PhiniX configuration features a 600W generator and a 640-channel photon direct-reading detector, offering intensity (or velocity) exceeding traditional floor-standing diffractometers. It is twice as effective as the mainstream compact diffractometer systems on the market, which typically use a 600W generator with 256 channels.

The optional 1200W X-ray source and 640-channel (or 1280-channel) photon direct-reading detector revolutionize the traditional understanding of compact diffractometers.

Pursuing intensity or resolution accuracy is no longer a trade-off.

Extensive Optical and Sample Fittings

N3 PhiniX Application Data Report Display

N3 PhiniX Application Data Report Display

N3 PhiniX low-angle diffraction data (silver behenate standard)

Application of N3 PhiniX diffraction data (SiC mixed phase) in phase composition analysis

Application of N3 PhiniX diffraction data in graphitization degree calculation

Application of N3 PhiniX diffraction data in full-spectrum structural analysis of ternary lithium batteries (NCM523)

X-ray reflectivity test

X-ray reflectivity (XRR) is a non-destructive surface-sensing technique that utilizes the interference effect between reflected and refracted X-rays at the surface and interface of thin films. It can analyze both crystalline and amorphous materials when there are differences in electron cloud density in the dielectric. Classic applications of XRR testing include: analyzing the total thickness of films (generally not exceeding 1 μm), the thickness of individual layers in repeated multilayer films, and the surface roughness of materials.

From a testing perspective, the incident and exit angles are kept consistent, i.e., θ/θ scanning mode.

$Grazing incidence X-ray diffraction$

Grazing incidence X-ray diffraction

Grazing incidence X-ray diffraction (GIXRD), as an advanced diffraction technique, avoids diffraction signals from deep layers of the sample or substrate material and maximizes information from the sample surface area by precisely controlling the angle of X-ray incident light (i.e., penetration depth).

GIXRD has significant characteristics in its implementation: the incident light angle remains constant at a low angle (within 5°), and the X-ray diffraction pattern is obtained by scanning the diffraction intensity along the diffraction angle using a detector.

$X-ray transmission diffraction$

X-ray transmission diffraction

Transmission is a special testing mode of X-ray diffraction (XRD in transmission). In transmission mode, X-rays pass through the sample to collect data. This mode is suitable for oriented samples such as certain polymer films and pharmaceuticals. Compared to reflection mode, transmission mode increases the path of X-rays through the sample and their interaction with the crystal plane, thus more effectively avoiding the influence of preferred orientation on peak intensity.

Routine powder testing

IDONANO Nanotechnology's X-ray diffractometers offer users testing solutions and ultra-high-quality data for various sample types (powders, thin films, etc.). Powder X-ray diffraction is one of the fundamental functions of IDONANO N3 series benchtop diffractometers. It employs Bragg-Brentano geometry reflection mode. The X-ray tube and detector are positioned on circles centered on the sample. This test uses θ/θ scanning mode.

Resources

$N3 PhiniX Multifunctional Desktop Diffraction Sample Booklet$

N3 PhiniX Multifunctional Desktop Diffraction Sample Booklet

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Specifications

Size	78cmX70cmX91cm (LxDxH)
Weight	120kg(Depending on configuration and attachments)
Total energy consumption	1kW-2kW(Depending on configuration and attachments)
X-ray generator	600W(40kV/15mA)1200W (40kV/30mA)
Goniometer	Standard Theta/Theta goniometerThe angle accuracy is better than ±0.01(2).
Detector	IDO640 Photon direct-reading one-dimensional array detector IDO1280 Photon direct-reading one-dimensional array detector PhiniX XE™ Two-dimensional energy-resolution array detector
Power requirements	200-240VAC
Cooling system	Internal air cooling or external water cooling
Instrument operation control	External computer
X-ray tube	Ceramic X-ray tubes, Cu/Co/Mo/Ag optional
Sample stage	Standard sample stage Rotary sample stage Rotary autosampler Thin film sample stage Capillary sample stage In-situ sample stage (variable temperature and battery in-situ)