Customized Solutions

Customized Solutions

Design a custom X-ray analysis system to meet unique needs.

Standardized instruments meet general analytical needs, but truly challenging scientific and industrial applications often require more targeted solutions. Leveraging its technological expertise in X-ray sources, diffraction optics, precision motion control, high-performance detectors, in-situ environments, and data analysis software, Eidon Nanotech can provide the design, development, and engineering services for specialized X-ray analysis systems tailored to the client's sample characteristics, testing objectives, application environment, and automation requirements. From an application concept to a stable analytical system, Eidon Nanotech collaborates with its clients.

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What can we customize?

Online and field analysis equipment

Online and field analysis equipment

We develop compact, modular, or online X-ray analysis systems for production lines, experimental setups, or special field environments, and support data integration with MES, LIMS, and customer control systems.

Automation and High-Throughput Systems

Automation and High-Throughput Systems

Based on the needs of the laboratory or production site, it integrates functions such as automatic sample introduction, sample recognition, robot interface, continuous measurement, automatic analysis and data uploading to improve analysis efficiency and equipment utilization.

Specialized analysis of new energy materials

Specialized analysis of new energy materials

For battery materials, catalytic materials and energy devices, develop structural analysis systems applicable to powders, electrode sheets, battery cells and reaction processes, supporting rapid detection, in-situ research and batch sample testing.

Semiconductor Materials and Device Measurement

Semiconductor Materials and Device Measurement

For wafer, epitaxial thin film, advanced packaging and semiconductor manufacturing processes, we develop dedicated measurement solutions such as XRD, HRXRD, XRR, and GID to enable the analysis of film structure, strain, orientation, crystal quality and interface characteristics.

In-situ and operating condition analysis system

In-situ and operating condition analysis system

Integrating in-situ environments such as high temperature, low temperature, atmosphere, vacuum, electrochemical, and mechanical loading, we study the structural evolution of materials under real reaction or working conditions.

Dedicated X-ray diffraction system

Dedicated X-ray diffraction system

For special samples, special geometries, and special testing methods, we develop customized X-ray diffraction systems, including the overall design of the light source, optical path, angle measurement system, sample stage, detector, and control software.

Turning Ideas into
Workable Analytical Systems

If existing standard instruments cannot fully meet your sample, method, or application needs, we welcome you to define the next X-ray analysis system with IDONATIONAL.

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