Looking to the future with a focus on the end goal: IDONANO showcases its capabilities at the 18th China X-ray Diffractometer User Conference.
From August 15th to 17th, 2026, the 18th China X-ray Diffractometer User Academic Exchange Conference was held at the Jinzhou Petroleum Hotel in Jinzhou City, Liaoning Province. This conference focused on cutting-edge technologies and diverse industrial applications in the field of X-ray analysis, conducting in-depth discussions on core topics such as crystal analysis, thin film analysis, stress detection, and scenario-based implementation. It is a highly authoritative and professional academic exchange event in the domestic XRD field.
As a national high-tech enterprise deeply involved in the R&D, manufacturing and industrialization of high-end X-ray analysis instruments, IDONANO technology (Shanghai) Co., Ltd. was invited to attend this conference and showcased its latest goniometer. The company engaged in in-depth exchanges with industry experts, research institutes and colleagues to jointly explore new ideas and directions for XRD technology innovation and industrial application.
Hardcore Exhibiting: Two Core Products Showcase the Strength of Domestic Products
At this exhibition, IDONANO showcased its two core diffractometer product series, comprehensively demonstrating the technical level and application capabilities of domestically produced high-end X-ray analysis instruments.
N3 PhiniX
Multifunctional Desktop X-ray Diffraction Solution
The N3 PhiniX series diffractometer boasts performance and functionality comparable to traditional large-scale diffractometers. Major components of the N3 utilize internationally leading, mature products, ensuring high performance and stability at every stage. It can meet various analytical needs, including qualitative and quantitative phase analysis, thin film grazing incidence, thin film reflectance, in-situ analysis, and pair distribution function (PDF) analysis.
N8 DiffraX
X-ray diffraction platform for characterizing advanced materials and complex samples
The N8 DiffraX is based on X-ray diffraction and features two different innovative optical systems: the DiffraX Vertex One™ optical system, which ensures full-spectrum angle accuracy, high resolution, excellent repeatability, high signal-to-noise ratio, and peak-to-background ratio; and the DiffraX Vertex Pro™ optical system, which provides systematic analysis capabilities for advanced materials, complex systems, and multi-scenario applications.
Keynote Speech: From Beginning to End, Explaining the Core Concepts of "Key Foundational Data"
During the conference, Yang Bing, Sales Director of IDONANO, delivered a special report entitled "Introduction to IDONANO Diffractometers", which systematically elaborated on IDONANO technical roadmap and product philosophy in the research and development of diffractometers.
The report takes "key basic data" as its core theme, starts from the actual needs of users, and traces back to the fundamental goal of instrument design - "to ensure the authenticity and reliability of every set of data from the beginning to the end".
This concept received high recognition from the experts present.
Working together to promote high-quality development of the industry
During their trip to Jinzhou, IDONANO not only showcased the latest technological achievements of domestically produced diffractometers but also gained valuable recognition and support through in-depth exchanges with industry experts. Professor Tao Kun's donation of algorithms will inject new momentum into EduNano's subsequent technological iterations and product optimization.
In the future, IDONANO will continue to uphold the R&D philosophy of "starting with the end in mind," deeply cultivate the field of X-ray analysis instruments, and provide more accurate, stable, and intelligent products and services to scientific research and industrial users. Together with industry partners, we will jointly promote the high-quality development of China's X-ray analysis industry.
About Us
