The IDONANO custom diffractometer passed TÜV SÜD EMC and LVD tests.

Edon Nano Achieves Another Success: First Domestically Produced X-ray Diffractometer Receives TÜV SÜD EMC and LVD Certifications

Recently, Edon Nano Technology (Shanghai) Co., Ltd.'s independently developed customized X-ray diffractometer successfully passed the Electromagnetic Compatibility Directive (EMC) and Low Voltage Directive (LVD) tests conducted by the internationally authoritative certification body TÜV SÜD, and obtained CE certification. Edon Nano's diffractometer thus becomes the first X-ray diffractometer system in China to pass CE certification, setting a significant milestone for domestically produced analytical instruments towards international standards.

This certification process strictly followed international standards, covering tests on the safety and stability of the equipment under operating conditions and in complex electromagnetic environments. The customized equipment that passed the tests not only meets the technical requirements of the international market but also provides users with a higher level of safety assurance. Edon Nano's diffractometer won high praise from the TÜV SÜD expert team for its superior performance, reliable design, and innovative technology. Dr. Liu Qian, Product Manager of EduNano Technology, stated that obtaining this certification is a result of the company's commitment to technological innovation and quality improvement, and also demonstrates the rise of Chinese high-tech enterprises in the field of analytical instruments. "This certification not only showcases the technological strength of our products but also provides us with greater confidence and assurance in expanding into international markets."

In the future, the company will continue to promote the marketization of X-ray analyzers both domestically and internationally, providing more high-quality solutions for materials science, industrial control, and research.