N3 PhiniX

X-ray Enclosed Light Tube | High-Stability X-ray Source Solution

Stable and reliable X-ray sources enable high-performance diffraction analysis

The X-ray tube is the core light source component of an X-ray diffractometer. Its stability, beam quality, and focal spot characteristics directly affect the quality of test data, analytical sensitivity, and long-term instrument performance. IDONANO provides enclosed X-ray tube solutions for high-performance X-ray diffraction analysis, covering a variety of target materials and power specifications. These solutions are compatible with IDONANO N-series X-ray diffractometers and mainstream XRD analysis platforms, providing stable, efficient, and reliable X-ray source support for scientific research and industrial applications.

Features

• High-reliability ceramic structure design: Utilizing an advanced ceramic insulation structure, it achieves excellent high-voltage withstand capability and long-term operational stability, ensuring continuous and reliable operation of the optical tube under high power and high load conditions.
• High-stability X-ray output: Optimized electron beam focusing and target design provide stable and uniform X-ray output, reducing intensity fluctuations during testing and improving data repeatability and reliability.

• Excellent beam quality enhances analytical performance. Stable X-ray beam quality effectively improves the signal-to-noise ratio and detection sensitivity, providing a high-quality data foundation for trace phase analysis, precision structural analysis, and complex material characterization.
• Fine focal spot design for high resolution and high efficiency. • Employing a long-life, fine focal spot design, it achieves superior spatial resolution and higher counting efficiency while maintaining high X-ray intensity, meeting the requirements of high-precision diffraction testing.

• Multiple target material options to meet diverse application needs. Supports various anode target configurations, including Cu (copper target), Co (cobalt target), Cr (chromium target), Mo (molybdenum target), and Ag (silver target). Meets the needs of different material systems and analytical requirements, including phase identification, quantitative analysis, thin film characterization, high-resolution XRD, and other application scenarios.

Compatible application platform

• IDONANO N-series X-ray diffractometer
• Bruker D8 Series X-ray Diffractometer

• Rigaku (Japan) Full Series of Enclosed Target X-ray Diffractometers
• Other mainstream closed-loop XRD analysis platforms

In-situ electrochemical environment chamber | Dedicated accessory for dynamic operating conditions (variable temperature/constant temperature)

In-situ electrochemical chamber for lithium batteries

A dedicated chamber for in-situ testing of lithium-ion battery charge and discharge, with reserved fluid and electrode interfaces, can capture the crystal structure evolution of positive and negative electrode materials in real time during the entire charge and discharge process, and is suitable for cutting-edge dynamic mechanism research on solid-state batteries and sodium-ion batteries.

Sample rack | Suitable for all types of samples

XRD sample trays of all series

• Covering four sample formats: powder, film, bulk, and trace powder:
  ● Metal circular substrate: multiple options available, including mirror blank substrate and light-shielding film/carbon film substrate;
  ● Dedicated sample holders: general powder holder, film sample holder, and special holder for trace low-load samples;
• It can be purchased in combination as needed to meet the sample preparation needs of special samples such as trace amounts, high fluorescence, and thin films.

X-ray optical path calibration tool | Fluorescent positioning target plate

Fluorescent calibration target plate

The fluorescent sensing target plate with concentric cross-shaped positioning scale can quickly complete the centering of the light spot, the alignment of the optical path, and the calibration of the detector position, shortening the equipment debugging cycle and reducing data deviation caused by human operation.

JADE and PDF database

Scientific flagship · High-precision diffraction data analysis kit

• Key Features - Applicable to all license levels
  · Reads XRD data collected from all diffractometers
  · Supports variable/fixed slit data
  · Automatic peak finding and multi-condition retrieval
  · Crystal structure simulation powder XRD patterns
  · No annual updates required
  · Individual license
  · Automatic peak finding and multi-condition retrieval
  · Independent of diffractometers—supports processing and analyzing data collected from multiple diffractometers
• Phase retrieval (retrieval/matching)
  · Confirm authorization level
  Level 2A includes phase retrieval module
  Level 3 includes phase retrieval module,
  Full image fitting and Rietveld refinement module
  · Phase identification (S/M)
  · Single-peak retrieval, identification of low-abundance phases

• Full Image Fitting (WPF) + Rietveld Refinement
  · Confirm License Level
  Level 2B includes Full Image Fitting WPF and Rietveld refinement modules
  Level 3 includes phase retrieval module,
  Full Image Fitting WPF and Rietveld refinement modules
  Full Image Fitting WPF & Rietveld Refinement

Match! Lightweight and Fast Analysis Software

Quantitative data analysis becomes a breeze

· Rapid phase identification

· Compatible with Windows, MacOS, and Linux operating systems

· Databases: Open Database of Crystallography (COD), ICDD PDF database, measured spectra, or calculated crystal structure spectra

· Qualitative analysis using innovative peak-fit search matching or classic peak-based search matching

· Quantitative analysis using Reference Intensity Ratio (RIR), Rietveld refinement, Crystallinity (DOC), and/or internal standard methods (table and pie chart display)

· Indexing (using Treor or Dicvol) - Crystal structure resolution (using Endeavour)

· Rietveld refinement and spectra decomposition (Le Bail method) calculations, backend using the renowned FullProf software

· Automated raw data processing

• Conveniently define/modify the background using the mouse - Easily edit peaks (add/move/delete/fit) using the mouse

• Zooming and tracking functions are available using the mouse or dialog boxes

• Display multiple diffraction patterns in 3D style for easy comparison

• Grain size estimation based on the Scherrer method